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A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology.
Manasa Madhvaraj
Salvador Mir
Manuel J. Barragan
Published in:
VLSI-SoC (2022)
Keyphrases
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silicon on insulator
cmos technology
ibm power processor
integrated circuit
metal oxide semiconductor
low power
low cost
nm technology
high resolution
high speed
cost effective
packet loss
power management
error resilience
dynamic random access memory