An advanced diagnostic method for delay faults in combinational faulty circuits.
Patrick GirardChristian LandraultSerge PravossoudovitchPublished in: J. Electron. Test. (1995)
Keyphrases
- similarity measure
- experimental evaluation
- high accuracy
- cost function
- objective function
- artificial neural networks
- high precision
- dynamic programming
- computational cost
- clustering method
- high speed
- probabilistic model
- asynchronous circuits
- optimization algorithm
- input data
- denoising
- fuzzy logic
- data sets
- prior knowledge
- neural network