Electrical Properties of Each Channels in Vertical Stacked Gate-All-Around Nanosheet s-Si pMOSFETs.

Jing Yan Junkang Li Rui Zhang

Published in: ICICDT (2023)

Keyphrases

electrical properties
leakage current
gate dielectrics
multi channel
multiscale
expert systems
communication channels
mimo systems
silicon nitride
real time
information retrieval
genetic algorithm
bayesian networks