Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine.
Jingyu ZhouShulin TianChenglin YangXuelong RenPublished in: Comput. Intell. Neurosci. (2014)
Keyphrases
- fault detection
- generation algorithm
- analog circuits
- fault diagnosis
- extreme learning machine
- neural network
- industrial processes
- feed forward neural networks
- expert systems
- support vector regression
- feedforward neural networks
- rbf neural network
- power plant
- support vector
- multi layer
- gaussian processes
- fuzzy logic
- digital circuits
- single layer
- hidden nodes
- activation function
- fuzzy sets
- real time