Second-Order Mutation Testing Cost Reduction Based on Mutant Clustering using SOM Neural Network Model.

Jing Liu Li Song

Published in: COMPSAC (2021)

Keyphrases

neural network model
cost reduction
self organizing maps
neural network
k means
mutation testing
artificial neural networks
unsupervised learning
clustering algorithm
neural gas
test sequences
cost savings
database applications
test generation
data points
optimal solution
bayesian networks
management system