A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter.
Takahiro J. YamaguchiMani SomaMasahiro IshidaHirobumi MushaLouis MalarsiePublished in: ITC (2002)
Keyphrases
- computationally efficient
- significant improvement
- computational cost
- classification accuracy
- high accuracy
- main contribution
- error rate
- preprocessing
- detection method
- fully automatic
- experimental evaluation
- optimization algorithm
- synthetic data
- test data
- segmentation method
- evaluation method
- optimization method
- face recognition
- segmentation algorithm
- feature set
- image registration
- cost function
- prior knowledge
- video sequences