AN SRAM Weak Cell Fault Model and a DFT Technique with a Programmable Detection Threshold.

Andrei Pavlov Manoj Sachdev José Pineda de Gyvez

Published in: ITC (2004)

Keyphrases

fault model
low cost
cell segmentation
false positives
false alarms
arabidopsis thaliana
detection algorithm
power consumption
threshold selection
object detection
detection method
discrete fourier transform
signal processing
image quality