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Influence of supplies on fast transient burst test in microcontrollers.

Yann BacherCesar GoriNicolas FroidevauxPhilippe DupreHenri BraquetGilles Jacquemod
Published in: LASCAS (2015)
Keyphrases
  • test cases
  • test data
  • case study
  • face recognition
  • hardware and software
  • software testing
  • multimedia
  • similarity measure
  • reinforcement learning
  • test suite