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A transitive closure algorithm for test generation.

Srimat T. ChakradharVishwani D. AgrawalSteven G. Rothweiler
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
  • transitive closure
  • learning algorithm
  • tree structure
  • machine learning
  • probability distribution
  • test generation
  • data warehouse
  • object oriented