Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs.
Rama Kumar PasumarthiV. R. DevanathanV. VisvanathanSeetal PotluriV. KamakotiPublished in: J. Low Power Electron. (2012)
Keyphrases
- high precision
- segmentation method
- high accuracy
- cost function
- detection method
- support vector machine svm
- experimental evaluation
- dynamic environments
- low cost
- support vector machine
- classification accuracy
- data sets
- dynamic programming
- significant improvement
- pairwise
- preprocessing
- computational complexity
- wireless sensor networks
- artificial neural networks
- scheduling problem
- input data
- video sequences
- computationally efficient
- theoretical analysis
- objective function
- detection algorithm
- feature extraction
- image processing
- feature selection