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An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits.
Tomoo Inoue
Toshinori Hosokawa
Takahiro Mihara
Hideo Fujiwara
Published in:
Asian Test Symposium (1998)
Keyphrases
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asynchronous circuits
worst case
logic circuits
databases
higher level
social networks
optimal solution
dynamic programming
high speed
data sets
real time
machine learning
genetic algorithm
language model
data driven
fault diagnosis
optimal control