Testing 90 nm microcontroller SRAM PUF quality.

Mario Barbareschi Ermanno Battista Antonino Mazzeo Nicola Mazzocca

Published in: DTIS (2015)

Keyphrases

high quality
low cost
low quality
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data sets
quality assurance
control system
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electronic devices
test set
test data
power consumption
quality assessment
cmos technology
real time
data acquisition