Built-in self-test of FPGA interconnect.
Charles E. StroudSajitha WijesuriyaCarter HamiltonMiron AbramoviciPublished in: ITC (1998)
Keyphrases
- built in self test
- high speed
- integrated circuit
- real time image processing
- hardware implementation
- field programmable gate array
- low power
- data acquisition
- hardware architectures
- single chip
- hardware design
- information systems
- signal processing
- low cost
- real world
- systolic array
- verilog hdl
- reconfigurable hardware
- dedicated hardware
- software implementation
- data mining