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Quality Control of Ultrasound Transducers using distribution-free Overlapping Coefficients.
Martin Angerer
Michael Zapf
Martin Koch
Nicole V. Ruiter
Published in:
IEEE SENSORS (2021)
Keyphrases
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quality control
distribution free
machine vision
large deviations
normal distribution
vc dimension
manufacturing systems
concept class
automated visual inspection
wavelet coefficients
sample complexity
feature extraction
reinforcement learning
worst case
graphical models
euclidean space