The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures.
Klaus ThonkeMartin SchirraRaoul SchneiderAnton ReiserGünther M. PrinzMartin FenebergJohannes BiskupekUte KaiserRolf SauerPublished in: Microelectron. J. (2009)