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The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures.

Klaus ThonkeMartin SchirraRaoul SchneiderAnton ReiserGünther M. PrinzMartin FenebergJohannes BiskupekUte KaiserRolf Sauer
Published in: Microelectron. J. (2009)
Keyphrases
  • state space
  • real time
  • database
  • information retrieval
  • decision making
  • website
  • hidden markov models
  • fuzzy logic
  • fault diagnosis
  • model based diagnosis
  • fault detection
  • fault model