Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST.

Yoshiyuki Nakamura Jacob Savir Hideo Fujiwara

Published in: IEICE Trans. Inf. Syst. (2005)

Keyphrases

levels of abstraction
three dimensional
high quality
pattern recognition
genetic algorithm
decision making
decision trees
digital libraries
higher level
defect detection