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Deep levels and nonlinear characterization of AlGaN/GaN HEMTs on silicon carbide substrate.
Malek Gassoumi
Jean-Marie Bluet
Christophe Gaquière
Gérard Guillot
Hassen Maaref
Published in:
Microelectron. J. (2009)
Keyphrases
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semiconductor devices
high density
low cost
levels of abstraction
magnetic recording
image processing
high speed
electron beam
data sets
genetic algorithm
structuring elements
lower level
high levels
nonlinear models
highly nonlinear
nonlinear equations