A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation.
Nidhi BatraShashwat KaushikAnil Kumar GunduMohammad S. HashmiG. S. VisweswaranAnuj GroverPublished in: SoCC (2016)
Keyphrases
- test data
- cost function
- detection method
- significant improvement
- similarity measure
- high precision
- high accuracy
- detection algorithm
- pairwise
- dynamic programming
- data sets
- error rate
- edge detection
- method assumes
- statistical significance
- estimation algorithm
- clustering method
- support vector machine svm
- computationally efficient
- classification accuracy
- probabilistic model
- color images
- image sequences
- neural network