Testing of Interposer-Based 2.5D Integrated Circuits: Challenges and Solutions.

Ran Wang Krishnendu Chakrabarty

Published in: ATS (2016)

Keyphrases

integrated circuit
lessons learned
electron beam
computational issues
optimal solution
image processing
key issues
practical solutions
technical challenges
search algorithm
lower bound
test set
test data
benchmark problems
information retrieval
open issues
data mining
real world