Analog Circuit Test using Transfer Function Coe .cient Estimates.
Zhen GuoJacob SavirPublished in: ITC (2003)
Keyphrases
- transfer function
- analog circuits
- fault diagnosis
- wavelet packet transform
- image enhancement
- digital circuits
- low pass filter
- neural network
- bp neural network
- frequency band
- high dynamic range
- contrast enhancement
- particle swarm optimization
- high speed
- hidden markov models
- pattern recognition
- feature extraction
- artificial intelligence