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Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time.
Michael S. Hsiao
Mainak Banga
Published in:
Asian Test Symposium (2009)
Keyphrases
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test data
test cases
training data
test set
data sets
relational databases
training and test data
database
data mining
training set
data model
collaborative filtering
text classification
semi supervised learning
test suite