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Coverage-Based Trace Signal Selection for Fault Localisation in Post-silicon Validation.
Charlie Shucheng Zhu
Georg Weissenbacher
Sharad Malik
Published in:
Haifa Verification Conference (2012)
Keyphrases
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fault diagnosis
signal processing
high speed
x ray
high density
real time
selection algorithm
compressive sensing
original signal
image processing
frequency domain
selection strategy