Partial scan design and test sequence generation based on reduced scan shift method.
Yoshinobu HigamiSeiji KajiharaKozo KinoshitaPublished in: J. Electron. Test. (1995)
Keyphrases
- high accuracy
- fully automatic
- objective function
- significant improvement
- computational cost
- preprocessing
- dynamic programming
- similarity measure
- high precision
- test data
- synthetic data
- detection method
- clustering method
- computationally efficient
- input data
- k means
- user interface
- pairwise
- reinforcement learning
- feature set
- cost function
- design process
- artificial neural networks
- decision trees
- statistical methods
- generation method