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On-Chip Test Embedding for Multi-Weighted Random LFSRs.
Dimitrios Kagaris
Spyros Tragoudas
Amitava Majumdar
Published in:
DFT (1998)
Keyphrases
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high speed
low cost
high density
case study
vector space
statistical tests
evolvable hardware
analog vlsi
built in self test
data sets
image processing
physical design
graph embedding
programmable logic