Ferroelectric Field Effect Transistors-Based Content-Addressable Storage-Class Memory: A Study on the Impact of Device Variation and High-Temperature Compatibility.
Athira SunilMasud Rana SKMaximilian LedererYannick RaffelFranz MüllerRicardo OlivoRaik HoffmannKonrad SeidelThomas KämpfeBhaswar ChakrabartiSourav DePublished in: Adv. Intell. Syst. (2024)