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Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults.

Ugur Çilingiroglu
Published in: J. Electron. Test. (2007)
Keyphrases
  • test cases
  • high speed
  • database systems
  • power consumption
  • neural network
  • learning algorithm
  • test set
  • fault diagnosis
  • parallel processing
  • magnetic field
  • analog circuits
  • fault model