ATPG and Test Compression for Probabilistic Circuits.

Kai-Chieh Yang Ming-Ting Lee Chen-Hung Wu James Chien-Mo Li

Published in: VLSI-DAT (2019)

Keyphrases

data compression
compression ratio
data driven
generative model
uncertain data
compression scheme
neural network
image compression
statistical tests
data sets
data structure
high speed
image quality
compression algorithm
probabilistic logic