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Double-gate FinFET process variation aware 10T SRAM cell topology design and analysis.

Nandakishor YadavSunil DuttManisha PattanaikG. K. Sharma
Published in: ECCTD (2013)
Keyphrases
  • design process
  • data analysis
  • case study
  • engineering design
  • product development
  • database
  • data sets
  • information systems
  • statistical analysis
  • power consumption
  • computer aided
  • design principles
  • automated analysis