Sensitivity Analysis of Design Parameters for Silicon Diodes.

Jean Michel D. Sellier Rayna Georgieva Ivan Tomov Dimov

Published in: NMA (2014)

Keyphrases

sensitivity analysis
design parameters
semiconductor devices
electron beam
high density
design space
managerial insights
variational inequalities
influence diagrams
image analysis
objective function
special case
parameter tuning
field effect transistors