Automated lateral sectioning for Knife-Edge Scanning Microscopy.

Jaerock Kwon David Mayerich Yoonsuck Choe Bruce H. McCormick

Published in: ISBI (2008)

Keyphrases

edge detection
image analysis
structured light
semi automatic
computer aided
fully automated
physical characteristics
image processing
low cost
image enhancement
edge detector
weighted graph
edge information
disjoint paths