Pursuing the Diffraction Limit with Nano-LED Scanning Transmission Optical Microscopy.
Sergio MorenoJoan CanalsVictor MoroNil FranchAnna VilàAlbert Romano-RodriguezJoan Daniel PradesDaria D. BezshlyakhAndreas WaagKatarzyna Kluczyk-KorchMatthias Auf der MaurAldo Di CarloSigurd KriegerSilvana GeleffÁngel DiéguezPublished in: Sensors (2021)
Keyphrases
- electron microscopy
- x ray
- image stacks
- electron microscope
- thin film
- transmission electron microscopy
- microscopy images
- data transmission
- image processing
- optical imaging
- three dimensional
- signal processing
- electron beam
- noisy channel
- switched networks
- long period
- structured light
- wavelength division multiplexing
- real time
- mimo ofdm
- optical properties
- waveguide
- data acquisition
- image analysis
- computer vision