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Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm Technology and Beyond.
Yoshihide Komatsu
Yukio Arima
Koichiro Ishibashi
Published in:
IEICE Trans. Electron. (2006)
Keyphrases
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nm technology
low power
power consumption
error rate
bi directional
bias variance decomposition
low variance
real time
human body
high density
variance reduction
video sequences
error bounds
error detection
measurement error