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Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs.
Jose Angel Ortiz Gonzalez
Ruizhu Wu
Saeed Jahdi
Olayiwola Alatise
Published in:
IEEE Trans. Ind. Electron. (2020)
Keyphrases
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