DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers.

Barry J. O'Sullivan AliReza Alian Arturo Sibaja Hernandez Jacopo Franco Sachin Yadav Hao Yu A. Rathi Uthayasankaran Peralagu Adrian Vaisman Chasin Bertrand Parvais Nadine Collaert

Published in: IRPS (2024)

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