Efficient and Robust TWSVM Classifier Based on L1-Norm Distance Metric for Pattern Classification.
He YanQiaolin YeTian'an ZhangDong-Jun YuPublished in: ACPR (2017)
Keyphrases
- pattern classification
- distance metric
- nearest neighbor rule
- feature extraction
- pattern recognition
- metric learning
- nearest neighbor classification
- distance function
- euclidean distance
- distance metric learning
- distance measure
- mass spectrometry data
- maximum margin
- decision boundary
- data points
- radial basis function neural network
- feature selection
- computer vision
- pattern classification problems
- knn
- data analysis
- similarity measure
- machine learning
- data mining