Defect tolerance in diode, FET, and four-terminal switch based nano-crossbar arrays.

Onur Tunali Mustafa Alton

Published in: NANOARCH (2015)

Keyphrases

schottky barrier
nano scale
high speed
computer simulation
defect detection
field effect transistors
light emitting
transmission line
signal analysis
signal processing
scheduling algorithm
atomic force microscopy
computer vision