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A D&T Special Report on ACM/SIGDA Design Automation Benchmarks: Catalyst or Anathema?
Franc Brglez
Published in:
IEEE Des. Test Comput. (1993)
Keyphrases
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design automation
test generation
circuit design
computer aided design
pattern recognition
machine learning
decision trees
relational databases
data mining
artificial intelligence
case study
image segmentation
object oriented