Defect Detection and Classification of Soybean Using Convolutional Neural Network.
Fritz Carvey A. BascaraAnalyn N. YumangPublished in: ICICT (2024)
Keyphrases
- convolutional neural network
- defect detection
- feature extraction
- classification scheme
- feature vectors
- face detection
- classification models
- pattern recognition
- classification accuracy
- image classification
- neural network
- pattern classification
- classification algorithm
- support vector machine svm
- machine learning
- data sets
- automatic classification
- model selection
- preprocessing
- feature selection
- document classification
- benchmark data sets
- decision rules
- cross validation
- class labels
- benchmark datasets
- machine learning algorithms
- high dimensional
- classification rules
- incremental learning
- cost sensitive
- similarity measure
- support vector machine
- classification systems
- multi class
- training samples