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nanoparticles.

Miguel Torres-CisnerosCelso Velásquez OrdóñezJosé J. Sánchez-MondragónA. CamperoOscar Gerardo Ibarra-ManzanoDaniel A. May-ArriojaHector Plascencia-MoraA. Espinoza-CalderónIgor A. Sukhoivanov
Published in: Microelectron. J. (2009)
Keyphrases
  • transmission electron microscopy
  • three dimensional
  • image processing
  • high resolution
  • electron microscopy
  • constraint satisfaction
  • high density