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Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction.
Xinyi Gong
Hu Su
De Xu
Jiabin Zhang
Lei Zhang
Zhengtao Zhang
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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coarse to fine
contour extraction
multiscale
perceptual grouping
multiresolution
object detection
image registration
edge detection
b spline
dynamic programming
control points
image processing
object recognition
affine transformation
complex background