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Defect Cause Search Support System Using Ontology and Bayesian Network in Liquid Crystal Display Manufacturing Process.

Kouki HamamotoAkira KitamuraSatoshi TaguchiShingo WatanabeHiroki Matsuno
Published in: KES (2016)
Keyphrases
  • manufacturing process
  • bayesian networks
  • quality control
  • knowledge base
  • domain knowledge
  • process control
  • product quality
  • real time
  • multi agent systems
  • source code
  • machine vision
  • discrete event