Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation.
Nanlin GuoFulin PengJiahe ShiFan YangJun TaoXuan ZengPublished in: ACM Trans. Design Autom. Electr. Syst. (2024)
Keyphrases
- analog circuits
- neural network
- fault diagnosis
- digital circuits
- bayesian networks
- optimization algorithm
- expert systems
- artificial neural networks
- fuzzy logic
- maximum likelihood
- highly non linear
- optimization method
- optimization problems
- high speed
- neural network model
- multilayer perceptron
- fuzzy neural network
- corner detection
- relational databases
- computer vision
- machine learning