A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion.
Irith PomeranzZvi KohaviPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1992)
Keyphrases
- computational cost
- linear complexity
- computational complexity
- space complexity
- digital circuits
- worst case
- learning algorithm
- convergence rate
- matching algorithm
- optimization algorithm
- dynamic programming
- np hard
- cost function
- k means
- preprocessing
- significant improvement
- search space
- detection algorithm
- search algorithm
- objective function
- efficient computation
- insertions and deletions
- memory requirements
- test cases
- probabilistic model
- multi agent
- similarity measure