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Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films.

Juli BlascoNestor Fabian GhenziJordi SuñéPablo LevyEnrique Miranda
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • electrical properties
  • equivalent circuit
  • chemical vapor deposition
  • real time
  • case study
  • stochastic process
  • silicon nitride