Fault Detection and Diagnosis in IP-Based Mission Critical Industrial Process Control Networks.
Young J. WonMi-Jung ChoiJames Won-Ki HongMyung-Sup KimHwa Won HwangJun Hyub LeeSung-Gyoo LeePublished in: IEEE Commun. Mag. (2008)
Keyphrases
- process control
- mission critical
- fault detection and diagnosis
- fault diagnosis
- fault detection
- real time systems
- control system
- product quality
- data centric
- semiconductor manufacturing
- data center
- industrial processes
- database
- induction motor
- ip addresses
- metadata
- dynamic model
- expert systems
- control charts
- databases
- mathematical model