Selective Trigger Scan Architecture for Reducing Power, Time and Data Volume in SoC Testing.
Shervin SharifiMohammad HosseinabadyZainalabedin NavabiPublished in: VLSI-SOC (2003)
Keyphrases
- data sets
- data structure
- data collection
- data quality
- data analysis
- complex data
- original data
- knowledge discovery
- raw data
- synthetic data
- database
- statistical analysis
- data generation
- training data
- network structure
- high dimensional data
- image data
- data processing
- data distribution
- test data
- power consumption
- data mining techniques
- end users
- prior knowledge
- xml documents
- hardware and software
- high quality