Deep open-set recognition for silicon wafer production monitoring.
Luca FrittoliDiego CarreraBeatrice RossiPasqualina FragnetoGiacomo BoracchiPublished in: Pattern Recognit. (2022)
Keyphrases
- semiconductor manufacturing
- recognition rate
- recognition accuracy
- object recognition
- manufacturing process
- real time
- low cost
- pattern recognition
- automatic recognition
- monitoring system
- feature extraction
- gesture recognition
- handwritten characters
- image recognition
- process control
- recognition process
- integrated circuit
- quality control
- production system
- face recognition
- hand gestures
- visual recognition
- massively parallel
- character recognition
- recognition algorithm
- shape recognition
- x ray
- high speed