A Deep Structured Learning Approach Towards Automating Connectome Reconstruction from 3D Electron Micrographs.
Jan FunkeFabian TschoppWilliam GrisaitisArlo SheridanChandan SinghStephan SaalfeldSrinivas C. TuragaPublished in: CoRR (2017)
Keyphrases
- structured learning
- electron micrographs
- cross sections
- conditional random fields
- three dimensional
- image reconstruction
- maximum margin
- learning models
- training process
- structured prediction
- semi supervised learning
- global features
- high resolution
- multi class
- neural network
- knn
- multi class classification
- hidden markov models
- cross section
- cross sectional
- max margin
- computer vision
- learning algorithm