GLOBAL FEATURES
Experts
- Takahiro Ogawa
- Marcin Zalasinski
- Miki Haseyama
- Robert Sabourin
- Krzysztof Cpalka
- Javier Ortega-Garcia
- Stefano Tubaro
- Qi Tian
- Wen Gao
- Yu-Shen Liu
- Alvaro Soto
- Umapada Pal
- Ling Guan
- Chunhua Shen
- Michael Blumenstein
- Zhizhong Han
- Christoph Trattner
- Arnaldo de Albuquerque Araújo
- Rainer Lienhart
- Mathilde Caron
- Manabu Okawa
- Armand Joulin
- A. Aydin Alatan
- Piotr Bojanowski
- Matthias Zwicker
- Julian Fiérrez-Aguilar
- David Picard
- Stefan M. Rüger
- Wataru Ohyama
- Ana Paula Brandão Lopes
- Domingo Mery
- Luca Baroffio
- Yuma Kinoshita
- C. V. Jawahar
- Alireza Alaei
- Ahmet Saracoglu
- Mehdi Elahi
- Marco Tagliasacchi
- Thomas Martin Lehmann
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- IEEE Access
- CVPR
- ICPR
- Pattern Recognit.
- ICCV
- TRECVID
- Sensors
- Neurocomputing
- Remote. Sens.
- ICASSP
- Pattern Recognit. Lett.
- ICDAR
- IEEE Trans. Image Process.
- ICRA
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- ACM Multimedia
- Expert Syst. Appl.
- J. Electronic Imaging
- SIBGRAPI
- CVPR Workshops
- IJCNN
- Inf. Sci.
- Signal Image Video Process.
- J. Vis. Commun. Image Represent.
- AAAI
- IROS
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- DICTA
- Vis. Comput.
- Comput. Vis. Image Underst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- CLEF (Working Notes)
- SMC
- BMVC
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