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Experts
- Miki Haseyama
- Marcin Zalasinski
- Takahiro Ogawa
- Robert Sabourin
- Krzysztof Cpalka
- Javier Ortega-Garcia
- Stefano Tubaro
- Qi Tian
- Arnaldo de Albuquerque Araújo
- Christoph Trattner
- Ling Guan
- Alvaro Soto
- Wen Gao
- Zhizhong Han
- Umapada Pal
- Chunhua Shen
- Yu-Shen Liu
- Michael Blumenstein
- David Picard
- Armand Joulin
- Manabu Okawa
- A. Aydin Alatan
- Mathilde Caron
- Matthias Zwicker
- Rainer Lienhart
- Julian Fiérrez-Aguilar
- Piotr Bojanowski
- Pablo Messina
- Seiichi Uchida
- Timothée Masquelier
- Tugrul K. Ates
- Ahmet Saracoglu
- Denis Parra
- Thomas Martin Lehmann
- Alireza Alaei
- Hitoshi Kiya
- Danilo Croce
- Alessandro Redondi
- Kensaku Mori
Venues
- CoRR
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- ICPR
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- Pattern Recognit. Lett.
- ICDAR
- IEEE Trans. Image Process.
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- J. Electronic Imaging
- Expert Syst. Appl.
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- Inf. Sci.
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- Signal Image Video Process.
- J. Vis. Commun. Image Represent.
- AAAI
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- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- DICTA
- Image Vis. Comput.
- Mach. Vis. Appl.
- SMC
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Multim.
- CLEF (Working Notes)
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