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Experts
- Miki Haseyama
- Marcin Zalasinski
- Takahiro Ogawa
- Krzysztof Cpalka
- Robert Sabourin
- Javier Ortega-Garcia
- Qi Tian
- Stefano Tubaro
- Zhizhong Han
- Alvaro Soto
- Yu-Shen Liu
- Chunhua Shen
- Wen Gao
- Umapada Pal
- Christoph Trattner
- Ling Guan
- Arnaldo de Albuquerque Araújo
- Michael Blumenstein
- David Picard
- Manabu Okawa
- Julian Fiérrez-Aguilar
- Mathilde Caron
- Rainer Lienhart
- Armand Joulin
- A. Aydin Alatan
- Piotr Bojanowski
- Matthias Zwicker
- Vicente Dominguez
- Denis Parra
- Masahiro Oda
- Alireza Alaei
- Matteo Cesana
- Hitoshi Kiya
- Hongxun Yao
- Pål Halvorsen
- Wataru Ohyama
- Michael Riegler
- Chi-Man Vong
- Luc Van Gool
Venues
- CoRR
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- Multim. Tools Appl.
- IEEE Access
- CVPR
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- Pattern Recognit.
- TRECVID
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- Remote. Sens.
- Pattern Recognit. Lett.
- ICDAR
- IEEE Trans. Image Process.
- ICRA
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- Expert Syst. Appl.
- J. Electronic Imaging
- IGARSS
- Inf. Sci.
- SIBGRAPI
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- CVPR Workshops
- Signal Image Video Process.
- J. Vis. Commun. Image Represent.
- AAAI
- Int. J. Pattern Recognit. Artif. Intell.
- IROS
- DICTA
- IEEE Trans. Circuits Syst. Video Technol.
- ICME
- CLEF (Working Notes)
- Comput. Vis. Image Underst.
- BMVC
- Mach. Vis. Appl.
- SMC
- IEEE Trans. Multim.
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