Fine-Grained Defect Diagnosis for CMOL FPGA Circuits.

Jihye Kim Hayoung Lee Seokjun Jang Sungho Kang

Published in: IEEE Access (2020)

Keyphrases

fine grained
high speed
coarse grained
power reduction
tightly coupled
fault models
model based diagnosis
access control
fault diagnosis
field programmable gate array
massively parallel
power consumption
low power
database management systems
logic circuits
data provenance